Contamination Collection & Sampling
Critical Facilities Solutions undertake sample collection and gathering using specific methods dependent on type of analysis. The locations are documented and the samples collected into suitable containers to ensure no cross contamination. The samples are sent to an independent laboratory for analysis using the latest and most efficient methods for determining the composition of a sample such as XRF or SEM followed by recommendations, proposals and quotations together with a detailed program and plan for any remediation works.
XRF (X-ray fluorescence) is a non-destructive analytical technique used to determine the elemental composition of materials. XRF analyzers determine the chemistry of a sample by measuring the fluorescent (or secondary) X-ray emitted from a sample when it is excited by a primary X-ray source.
Scanning Electron Microscopy (SEM), also known as SEM analysis or SEM microscopy, is used very effectively in microanalysis and failure analysis of solid inorganic materials. Electron microscopy is performed at high magnifications, generates high-resolution images and precisely measures very small features and objects.
CFS uses one of the above or more bespoke testing to analyze the samples we collet. We use SEM to test for Zinc Whisker, XRF to analyze the majority of other samples to determine there composition. With XRF we can identify almost all the elements of the periodic table and provide extremely accurate feed back on the make up, and therefore source, of contamination.